Correlated IA

To support the use of Attachment Circuit TC for connecting edge devices to VPRN and VPLS a new type of Correlated Impact Analysis has been introduced.

Correlated Impact Analysis is able to identify which Attachment Circuit TC / SAP have been indirectly affected when the VPNs LSPs, Pseudowire and Service Tunnels are analyzed.

Logic

When a Pseudowire or Service Tunnel is affected as a result of an LSP being affected in the core, ConnectMaster will perform the following:

1)Identify the affected VPN (based on the Pseudowire / Service Tunnel relationship)

2)Identify the SAP at the A and Z ends

3)Identify any Attachment TC connected to the affected SAP

4)The affect being Disabled, Protected, etc will then be applied to the SAP

5)One record for both A and Z ends will be displayed in the results .ie

6)Correlated results are blue in colour

Result Format

SAP

If there is no Attachment Circuit, then the result is as follows:

VPN Name<Sap Port Name> -> Location X .ie VPLS XYZ<1/4/1:4> -> Sydney

Result Format

Attachment TC

If there is an Attachment Circuit, then the result is as follows:

VPN Name<VI Name>Sap Port Name<Attachment Circuit TC Name>

.ie VPLS XYZ<VSI#1>1/4/1:4<SCADA SITE Melbourne Uplink> -> Sydney

Single Uplink

Example

Results

Dual Homed Uplink

Example

(Future)

Results

Screen Example

The IA may return a mix of results depending on the paths of the LSP and whether SAPs have any Attachment Circuit TC.